Topas Users Meeting
Topas Users Meeting will take place prior to EPDIC17, May, 29-31
The meeting provides a review of state of the art profile fitting analyses using TOPAS, hosting a program of invited speakers.
The major component is to demonstrate TOPAS's outstanding modeling methods and related applications in X-ray and neutron diffraction.
Participate at Topas Users Meeting
Participation is open for anyone, TOPAS users and non-users, interested in learning more about the TOPAS capabilities and applications. If you wish to participate at Topas Users Meeting please register via MyEPDIC17.
Please consult Registration tab for the information about the registration fee. Specially negotiated prices for EPDCI17 in Hotel Ivan and Hotel Niko will be valid during the Topas Users Meeting as well.
Participants are encouraged to submit discussion topics in advance to the organizers. The final schedule will take issues of general interest into account.
Presentations and example data used will be distributed to the participants as made available by the speakers.
Crystal structure determination and refinement
Quantitative phase analysis
Pair distribution function analysis
Arnt Kern, Bruker AXS, Germany
Dragica Prill, Frankfurt University, Germany
Marcus Mendenhall, NIST, US
Paolo Scardi , University of Trento, IT
Dominique Ectors, Bruker AXS, DE
Matthew Rowles, Curtin University, AUS
Robert Dinnebier, MPI Stuttgart, DE
Martin Rudolph, TU Freiberg, DE
Martin Etter, DESY, Hamburg
Phil Chater, Diamond, UK
Antonis Vamvakeros, University College London, UK
Michael Evans, Bruker AXS, DE
Dorota Matras, University of Manchester and Finden ltd., UK
David Wragg, University of Oslo, NO
Maxwell Terban, MPI Stuttgart, DE
Martin-Ulrich Schmidt, , Uni Frankfurt, DE
Luzia Germann, McGill University, CA
Scott Misture, Alfred University, USA
Pamela Whitfield, Excelsus, CH
Peter Stephens, SUNY at Stonybrook, USA
Peter Khalifah, Stony Brook University, USA
Sebastian Bette, MPI Stuttgart, DE
Gianpiero Gallo, MPI Stuttgart, DE